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Transient-induced latchup in CMOS integrated circuits

I tiakina i:

Ngā taipitopito rārangi puna kōrero
Kaituhi matua:	Ker, Ming-Dou
Kaituhi rangatōpū:	ebrary, Inc
Ētahi atu kaituhi:	Hsu, Sheng-Fu
Hōputu:	Tāhiko īPukapuka
Reo:	Ingarihi
I whakaputaina:	Singapore ; Hoboken, NJ : Wiley, c2009.
Ngā marau:	Metal oxide semiconductors, Complementary > Defects. Metal oxide semiconductors, Complementary > Reliability. Electronic books.
Urunga tuihono:	An electronic book accessible through the World Wide Web; click to view
Ngā Tūtohu:	Tāpirihia he Tūtohu Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!

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