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Transient-induced latchup in CMOS integrated circuits

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Detalles Bibliográficos
Autor Principal:	Ker, Ming-Dou
Autor Corporativo:	ebrary, Inc
Outros autores:	Hsu, Sheng-Fu
Formato:	Electrónico eBook
Idioma:	inglés
Publicado:	Singapore ; Hoboken, NJ : Wiley, c2009.
Subjects:	Metal oxide semiconductors, Complementary > Defects. Metal oxide semiconductors, Complementary > Reliability. Electronic books.
Acceso en liña:	An electronic book accessible through the World Wide Web; click to view
Tags:	Engadir etiqueta Sen Etiquetas, Sexa o primeiro en etiquetar este rexistro!

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