ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.

I tiakina i:
Ngā taipitopito rārangi puna kōrero
Ngā kaituhi rangatōpū: International Symposium for Testing and Failure Analysis Los Angeles, Calif., ASM International. Electronic Materials and Processing Division, ebrary, Inc
Hōputu: Tāhiko Mauhanga Hui īPukapuka
Reo:Ingarihi
I whakaputaina: Materials Park, Ohio : ASM International, c1996.
Ngā marau:
Urunga tuihono:An electronic book accessible through the World Wide Web; click to view
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