ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /

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书目详细资料
企业作者:	International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
格式:	电子会议录电子书
语言:	英语
出版:	Materials Park, OH : ASM International, c2005.
主题:	Electronics > Materials > Testing > Congresses. Electronic apparatus and appliances > Testing > Congresses. Electronic books.
在线阅读:	An electronic book accessible through the World Wide Web; click to view
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