Lua APA (7ú heag.)

International Symposium for Testing and Failure Analysis Santa Clara, Calif, ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2001). ISTFA 2001: Proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California. ASM International.

Lua i Stíl Chicago (17ú heag.)

International Symposium for Testing and Failure Analysis Santa Clara, Calif, ASM International, Electronic Device Failure Analysis Society, agus Inc ebrary. ISTFA 2001: Proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California. Materials Park, OH: ASM International, 2001.

Lua MLA (9ú heag.)

International Symposium for Testing and Failure Analysis Santa Clara, Calif, et al. ISTFA 2001: Proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California. ASM International, 2001.

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