ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

Na minha lista:
Detalhes bibliográficos
Corporate Authors: International Symposium for Testing and Failure Analysis Bellevue, Wash., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Formato: Recurso Electrónico Conference Proceeding livro electrónico
Idioma:inglês
Publicado em: Materials Park, OH : ASM International, c2000.
Assuntos:
Acesso em linha:An electronic book accessible through the World Wide Web; click to view
Tags: Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!