ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
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企业作者: | International Symposium for Testing and Failure Analysis Bellevue, Wash., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc |
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格式: | 电子 会议录 电子书 |
语言: | 英语 |
出版: |
Materials Park, OH :
ASM International,
c2000.
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在线阅读: | An electronic book accessible through the World Wide Web; click to view |
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