ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Enregistré dans:
Collectivités auteurs: | International Symposium for Testing and Failure Analysis Bellevue, Wash., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc |
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Format: | Électronique Actes de congrès eBook |
Langue: | anglais |
Publié: |
Materials Park, OH :
ASM International,
c2000.
|
Sujets: | |
Accès en ligne: | An electronic book accessible through the World Wide Web; click to view |
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