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Radiation effects and soft errors in integrated circuits and electronic devices

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Detalles Bibliográficos
Autor Corporativo:	ebrary, Inc
Outros autores:	Schrimpf, Ronald Donald, Fleetwood, D. M. (Dan M.)
Formato:	Electrónico eBook
Idioma:	inglés
Publicado:	Singapore ; New Jersey : World Scientific Pub., c2004.
Series:	Selected topics in electronics and systems ; vol. 34.
Subjects:	Electronic circuits > Effect of radiation on. Integrated circuits > Effect of radiation on. Electronic books.
Acceso en liña:	An electronic book accessible through the World Wide Web; click to view
Tags:	Engadir etiqueta Sen Etiquetas, Sexa o primeiro en etiquetar este rexistro!

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