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Terrestrial neutron-induced soft errors in advanced memory devices

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Detalhes bibliográficos
Autor Corporativo:	ebrary, Inc
Outros Autores:	Nakamura, Takashi, 1939-
Formato:	Recurso Electrónico livro electrónico
Idioma:	inglês
Publicado em:	Hackensack, NJ : World Scientific, c2008.
Assuntos:	Semiconductor storage devices. Neutron irradiation. Radiation dosimetry. Nuclear physics. Electronic books.
Acesso em linha:	An electronic book accessible through the World Wide Web; click to view
Tags:	Adicionar Tag Sem tags, seja o primeiro a adicionar uma tag!

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