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Terrestrial neutron-induced soft errors in advanced memory devices

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Detalles Bibliográficos
Autor Corporativo:	ebrary, Inc
Outros autores:	Nakamura, Takashi, 1939-
Formato:	Electrónico eBook
Idioma:	inglés
Publicado:	Hackensack, NJ : World Scientific, c2008.
Subjects:	Semiconductor storage devices. Neutron irradiation. Radiation dosimetry. Nuclear physics. Electronic books.
Acceso en liña:	An electronic book accessible through the World Wide Web; click to view
Tags:	Engadir etiqueta Sen Etiquetas, Sexa o primeiro en etiquetar este rexistro!

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