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Terrestrial neutron-induced soft errors in advanced memory devices

Sábháilte in:

Sonraí bibleagrafaíochta
Údar corparáideach:	ebrary, Inc
Rannpháirtithe:	Nakamura, Takashi, 1939-
Formáid:	Leictreonach Ríomhleabhar
Teanga:	Béarla
Foilsithe / Cruthaithe:	Hackensack, NJ : World Scientific, c2008.
Ábhair:	Semiconductor storage devices. Neutron irradiation. Radiation dosimetry. Nuclear physics. Electronic books.
Rochtain ar líne:	An electronic book accessible through the World Wide Web; click to view
Clibeanna:	Cuir clib leis Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!

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