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Terrestrial neutron-induced soft errors in advanced memory devices

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Bibliographic Details
Corporate Author:	ebrary, Inc
Other Authors:	Nakamura, Takashi, 1939-
Format:	Electronic eBook
Language:	English
Published:	Hackensack, NJ : World Scientific, c2008.
Subjects:	Semiconductor storage devices. Neutron irradiation. Radiation dosimetry. Nuclear physics. Electronic books.
Online Access:	An electronic book accessible through the World Wide Web; click to view
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