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Terrestrial neutron-induced soft errors in advanced memory devices

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Podrobná bibliografie
Korporativní autor:	ebrary, Inc
Další autoři:	Nakamura, Takashi, 1939-
Médium:	Elektronický zdroj E-kniha
Jazyk:	angličtina
Vydáno:	Hackensack, NJ : World Scientific, c2008.
Témata:	Semiconductor storage devices. Neutron irradiation. Radiation dosimetry. Nuclear physics. Electronic books.
On-line přístup:	An electronic book accessible through the World Wide Web; click to view
Tagy:	Přidat tag Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!

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