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System-on-chip test architectures nanometer design for testability /

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Bibliographic Details
Corporate Author:	ebrary, Inc
Other Authors:	Wang, Laung-Terng, Stroud, Charles E., Touba, Nur A.
Format:	Electronic eBook
Language:	English
Published:	Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008.
Series:	Morgan Kaufmann series in systems on silicon.
Subjects:	Systems on a chip > Testing. Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Design. Electronic books.
Online Access:	An electronic book accessible through the World Wide Web; click to view
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