Delwedd Flaen

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High tech trash digital devices, hidden toxics, and human health /

Wedi'i Gadw mewn:

Manylion Llyfryddiaeth
Prif Awdur:	Grossman, Elizabeth, 1957-
Awdur Corfforaethol:	ebrary, Inc
Fformat:	Electronig eLyfr
Iaith:	Saesneg
Cyhoeddwyd:	Washington : Island Press : Shearwater Books, c2006.
Pynciau:	Electronic waste. Electronic apparatus and appliances > Environmental aspects. Electronic apparatus and appliances > Health aspects. Product life cycle. Electronic books.
Mynediad Ar-lein:	An electronic book accessible through the World Wide Web; click to view
Tagiau:	Ychwanegu Tag Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!

Eitemau Tebyg

Digital rubbish natural history of electronics /
gan: Gabrys, Jennifer
Cyhoeddwyd: (2011)

Solid state electronic devices /
gan: Streetman, Ben G.
Cyhoeddwyd: (2010)

Guide to state-of-the-art electron devices
Cyhoeddwyd: (2013)

Novel architectures for flexible electrochemical devices and systems
gan: Kawahara, Jun
Cyhoeddwyd: (2013)

Electronic components and processes
gan: Maheshwari, Preeti
Cyhoeddwyd: (2006)

Electronic : devices and circuits /
gan: Kulshreshtha, D. c.
Cyhoeddwyd: (2006)

A designer's guide to built-in self-test
gan: Stroud, Charles E.
Cyhoeddwyd: (2002)

Electronic devices and amplifier circuits with MATLABʼ / Simulinkʼ / SimElectronics ʼ examples
gan: Karris, Steven T.
Cyhoeddwyd: (2012)

Parts selection and management
Cyhoeddwyd: (2004)

Electronic materials science
gan: Irene, Eugene A.
Cyhoeddwyd: (2005)

Hertzian tales electronic products, aesthetic experience, and critical design /
gan: Dunne, Anthony
Cyhoeddwyd: (2005)

Polymers for electricity and electronics materials, properties, and applications /
gan: Drobny, Jiri George
Cyhoeddwyd: (2012)

ESD basics from semiconductor manufacturing to use /
gan: Voldman, Steven H.
Cyhoeddwyd: (2012)

Electronic devices : a text and software problems manual /
gan: Schultz, Mitchel E.
Cyhoeddwyd: (1994)

Introduction to microfabrication
gan: Franssila, Sami
Cyhoeddwyd: (2010)

Electrical characterization of organic electronic materials and devices
gan: Stallinga, Peter, 1966-
Cyhoeddwyd: (2009)

EMC for product designers
gan: Williams, Tim, 1954-
Cyhoeddwyd: (2007)

Design for at-speed test, diagnosis, and measurement
Cyhoeddwyd: (2000)

Polymers for electronic components a Rapra industry analysis report /
gan: Cousins, Keith
Cyhoeddwyd: (2001)

Designing the internet of things /
gan: McEwen, Adrian
Cyhoeddwyd: (2014)

Digital Rubbish : A Natural History of Electronics /
gan: Gabrys, Jennifer
Cyhoeddwyd: (2011)

Single-electron devices and circuits in silicon
gan: Durrani, Zahid Ali Khan
Cyhoeddwyd: (2010)

ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
Cyhoeddwyd: (2011)

ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
Cyhoeddwyd: (2010)

ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
Cyhoeddwyd: (2009)

ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
Cyhoeddwyd: (2002)

ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
Cyhoeddwyd: (2007)

ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
Cyhoeddwyd: (1999)

ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
Cyhoeddwyd: (2005)

ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /
Cyhoeddwyd: (1997)

ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
Cyhoeddwyd: (1998)

ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
Cyhoeddwyd: (1996)

ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Cyhoeddwyd: (2004)

ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
Cyhoeddwyd: (2003)

ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Cyhoeddwyd: (2008)

ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Cyhoeddwyd: (2000)

ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
Cyhoeddwyd: (2001)

ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
Cyhoeddwyd: (2013)

ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
Cyhoeddwyd: (2014)

ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
Cyhoeddwyd: (2012)