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VLSI test principles and architectures design for testability /

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Podrobná bibliografie
Další autoři:	Wang, Laung-Terng, Wu, Cheng-Wen, EE Ph. D., Wen, Xiaoqing
Médium:	Elektronický zdroj E-kniha
Jazyk:	angličtina
Vydáno:	Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006.
Edice:	Morgan Kaufmann series in systems on silicon.
Témata:	Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Design. Electronic books.
On-line přístup:	An electronic book accessible through the World Wide Web; click to view
Tagy:	Přidat tag Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!

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