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Fault injection techniques and tools for embedded systems reliability evaluation

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Coauteur: ebrary, Inc
Andere auteurs: Benso, Alfredo, Prinetto, Paolo
Formaat: Elektronisch E-boek
Taal:Engels
Gepubliceerd in: Boston : Kluwer Academic Publishers, c2003.
Reeks:Frontiers in electronic testing ; 23.
Onderwerpen:
Embedded computer systems > Testing.
Embedded computer systems > Reliability.
Fault location (Engineering)
Electronic books.
Online toegang:An electronic book accessible through the World Wide Web; click to view
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010 |z  2003061871 
020 |z 1402075898 (alk. paper) 
035 |a (CaPaEBR)ebr10078628 
035 |a (OCoLC)232158235 
040 |a CaPaEBR  |c CaPaEBR 
050 1 4 |a TK7895.E42  |b F38 2003eb 
082 0 4 |a 004.2/56  |2 22 
245 0 0 |a Fault injection techniques and tools for embedded systems reliability evaluation  |h [electronic resource] /  |c edited by Alfredo Benso and Paolo Prinetto. 
260 |a Boston :  |b Kluwer Academic Publishers,  |c c2003. 
300 |a xiv, 241 p. :  |b ill. 
490 1 |a Frontiers in electronic testing ;  |v 23 
504 |a Includes bibliographical references (p. [231]-241). 
533 |a Electronic reproduction.  |b Palo Alto, Calif. :  |c ebrary,  |d 2009.  |n Available via World Wide Web.  |n Access may be limited to ebrary affiliated libraries. 
650 0 |a Embedded computer systems  |x Testing. 
650 0 |a Embedded computer systems  |x Reliability. 
650 0 |a Fault location (Engineering) 
655 7 |a Electronic books.  |2 local 
700 1 |a Benso, Alfredo. 
700 1 |a Prinetto, Paolo. 
710 2 |a ebrary, Inc. 
830 0 |a Frontiers in electronic testing ;  |v 23. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10078628  |z An electronic book accessible through the World Wide Web; click to view 
908 |a 170314 
942 0 0 |c EB 
999 |c 67121  |d 67121 

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