Design for at-speed test, diagnosis, and measurement

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Bibliographic Details
Corporate Author:	ebrary, Inc
Other Authors:	Nadeau-Dostie, Benoit
Format:	Electronic eBook
Language:	English
Published:	Boston : Kluwer Academic, c2000.
Series:	Frontiers in electronic testing.
Subjects:	Integrated circuits > Testing. Electronic apparatus and appliances > Testing. Electronic books.
Online Access:	An electronic book accessible through the World Wide Web; click to view
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