检索结果 - Wang, Laung-Terng
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1
System-on-chip test architectures nanometer design for testability /
出版 2008其他作者: “...Wang, Laung-Terng...”
索引号: 载入...An electronic book accessible through the World Wide Web; click to view
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2
VLSI test principles and architectures design for testability /
出版 2006其他作者: “...Wang, Laung-Terng...”
索引号: 载入...An electronic book accessible through the World Wide Web; click to view
位于: 载入...
电子 电子书