Search Results - Wang, Laung-Terng

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  1. 1

    System-on-chip test architectures nanometer design for testability /

    Published 2008
    Other Authors: “…Wang, Laung-Terng…”
    An electronic book accessible through the World Wide Web; click to view
    Electronic eBook
  2. 2

    VLSI test principles and architectures design for testability /

    Published 2006
    Other Authors: “…Wang, Laung-Terng…”
    An electronic book accessible through the World Wide Web; click to view
    Electronic eBook