Søgeresultater - Wang, Laung-Terng
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1
System-on-chip test architectures nanometer design for testability /
Udgivet 2008Andre forfattere: “...Wang, Laung-Terng...”
Klassifikationsnummer: Loading...An electronic book accessible through the World Wide Web; click to view
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Electronisk eBog -
2
VLSI test principles and architectures design for testability /
Udgivet 2006Andre forfattere: “...Wang, Laung-Terng...”
Klassifikationsnummer: Loading...An electronic book accessible through the World Wide Web; click to view
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Electronisk eBog