Torthaí cuardaigh - Wang, Laung-Terng

  • 1 - 2 toradh as 2 á dtaispeáint
Beachtaigh na torthaí
  1. 1

    System-on-chip test architectures nanometer design for testability /

    Foilsithe / Cruthaithe 2008
    Rannpháirtithe: “…Wang, Laung-Terng…”
    An electronic book accessible through the World Wide Web; click to view
    Leictreonach Ríomhleabhar
  2. 2

    VLSI test principles and architectures design for testability /

    Foilsithe / Cruthaithe 2006
    Rannpháirtithe: “…Wang, Laung-Terng…”
    An electronic book accessible through the World Wide Web; click to view
    Leictreonach Ríomhleabhar