检索结果 - Chakrabarty, Krishnendu

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  1. 1
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    Wafer-level testing and test during burn-in for integrated circuits 由 Bahukudumbi, Sudarshan

    出版 2010
    其他作者: “...Chakrabarty, Krishnendu...”
    An electronic book accessible through the World Wide Web; click to view
    电子 电子书

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  2. 2
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    Wafer-level testing and test during burn-in for integrated circuits 由 Bahukudumbi, Sudarshan

    出版 2010
    其他作者: “...Chakrabarty, Krishnendu...”
    An electronic book accessible through the World Wide Web; click to view
    电子 电子书

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  3. 3
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    Adaptive cooling of integrated circuits using digital microfluidics 由 Paik, Philip Y.

    出版 2007
    其他作者: “...Chakrabarty, Krishnendu...”
    An electronic book accessible through the World Wide Web; click to view
    电子 电子书

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  4. 4
    封面图片

    Adaptive cooling of integrated circuits using digital microfluidics 由 Paik, Philip Y.

    出版 2007
    其他作者: “...Chakrabarty, Krishnendu...”
    An electronic book accessible through the World Wide Web; click to view
    电子 电子书

    加到收藏夹
    Saved in:

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