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  1. 1

    Wafer-level testing and test during burn-in for integrated circuits 著者: Bahukudumbi, Sudarshan

    出版事項 2010
    その他の著者: “…Chakrabarty, Krishnendu…”
    An electronic book accessible through the World Wide Web; click to view
    電子媒体 eBook
  2. 2

    Wafer-level testing and test during burn-in for integrated circuits 著者: Bahukudumbi, Sudarshan

    出版事項 2010
    その他の著者: “…Chakrabarty, Krishnendu…”
    An electronic book accessible through the World Wide Web; click to view
    電子媒体 eBook
  3. 3

    Adaptive cooling of integrated circuits using digital microfluidics 著者: Paik, Philip Y.

    出版事項 2007
    その他の著者: “…Chakrabarty, Krishnendu…”
    An electronic book accessible through the World Wide Web; click to view
    電子媒体 eBook
  4. 4

    Adaptive cooling of integrated circuits using digital microfluidics 著者: Paik, Philip Y.

    出版事項 2007
    その他の著者: “…Chakrabarty, Krishnendu…”
    An electronic book accessible through the World Wide Web; click to view
    電子媒体 eBook