Torthaí cuardaigh - Chakrabarty, Krishnendu

  • 1 - 2 toradh as 2 á dtaispeáint
Beachtaigh na torthaí
  1. 1

    Wafer-level testing and test during burn-in for integrated circuits de réir Bahukudumbi, Sudarshan

    Foilsithe / Cruthaithe 2010
    Rannpháirtithe: “…Chakrabarty, Krishnendu…”
    An electronic book accessible through the World Wide Web; click to view
    Leictreonach Ríomhleabhar
  2. 2

    Adaptive cooling of integrated circuits using digital microfluidics de réir Paik, Philip Y.

    Foilsithe / Cruthaithe 2007
    Rannpháirtithe: “…Chakrabarty, Krishnendu…”
    An electronic book accessible through the World Wide Web; click to view
    Leictreonach Ríomhleabhar