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  1. 1

    ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.

    出版事項 1996
    “…ASM International. Electronic Materials and Processing Division…”
    An electronic book accessible through the World Wide Web; click to view
    電子媒体 会議録 eBook
  2. 2

    ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.

    出版事項 1996
    “…ASM International. Electronic Materials and Processing Division…”
    An electronic book accessible through the World Wide Web; click to view
    電子媒体 会議録 eBook