Risultati della ricerca - "synchrotron radiation"

The physics of synchrotron radiation di Hofmann, Albert, 1933-

Sommario: “...Introduction -- pt. 2. Synchrotron radiation -- pt. 3. Undulator radiation -- pt. 4. ...”
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Trends of synchrotron radiation applications in cultural heritage, forensics and materials science /

Soggetti: “...Synchrotron radiation....”
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Modern techniques for circular dichroism and synchrotron radiation circular dichroism spectroscopy

Soggetti: “...Synchrotron radiation....”
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Proceedings of the Workshop on Synchrotron Radiation and Nanostructures papers in honour of Paolo Perfetti /

Soggetti: “...Synchrotron radiation Congresses....”
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Liquid surfaces and interfaces synchrotron X-ray methods / di Pershan, Peter S., 1934-

Soggetti: “...Synchrotron radiation....”
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Accelerator physics, technology, and applications selected lectures of OCPA International Accelerator School 2002, Singapore /

Soggetti: “...Synchrotron radiation Congresses....”
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Mechanical stress evaluation by neutrons and synchrotron radiation VI : selected, peer reviewed papers from the 6th International Conference on Mechanical Stress Evaluation by Neutrons and Synchrotron Radiation (MECA SENS VI 2011), September 7-9, 2011, Hamburg, Germany /

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Mechanical stress evaluation by neutrons and synchrotron radiation VII : selected, peer reviewed papers from the 7th International Conference on Mechanical Stress Evaluation by Neutrons and Synchrotron Radiation (MECA SENS VII 2013), September 10-12, 2013, Sydney, Australia /

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Cooperative stewardship managing the nation's multidisciplinary user facilities for research with synchrotron radiation, neutrons, and high magnetic fields /

Soggetti: “...Synchrotron radiation sources United States....”
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X-ray fluorescence spectrometry and related techniques an introduction / di Margu�i, Eva

Sommario: “...Special XRF configurations and related techniques -- 7.1 Introduction -- 7.2 Microbeam X-ray fluorescence spectrometry ([mu]-XRF) -- 7.3 Synchrotron radiation-induced X-ray emission (SRXRF or SRIXE) -- 7.4 Particle-induced X-ray emission (PIXE) -- 7.5 Electron-induced X-ray emission -- 7.5.1 Scanning electron microscope (SEM) -- 7.5.2 Electron microprobe analysis (EMPA) --...”
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Electron dynamics by inelastic X-ray scattering di Schülke, Winfried

“...Oxford series on synchrotron radiation ;...”
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The X-ray standing wave technique principles and applications /

“...World Scientific series on synchrotron radiation techniques and applications ;...”
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In-situ characterization of heterogeneous catalysts

Sommario: “...Mark Newton (European Synchrotron Radiation Facility), Marcos Fernandez-Garcia (Catalysis Institute of CSIC, Madrid) Chapter 15: XRD-Raman and Modulation Excitation Spectroscopy Wouter van Beek (European Synchrotron Radiation Facility), Atsushi Urakawa (European Synchrotron Radiation Facility), Marco Milanesio (European Synchrotron Radiation Facility) Chapter 16: Catalyst Imaging using Synchrotron-based Multi-technique Approaches Andew M. ...”
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Mössbauer spectroscopy : applications in chemistry, biology, and nanotechnology /

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Technology evolution for silicon nano-electronics selected, peer reviewed papers from the proceedings of the International Symposium on Technology Evolution for Silicon Nano-Electr...

Sommario: “...High Mobility Ge-Based CMOS Device Technologies -- SiGe-Mixing-Triggered Rapid-Melting-Growth of High-Mobility Ge-On-Insulator -- Impact of Self-Heating Effect on the Electrical Characteristics of Nanoscale Devices -- Functional Device Applications of Nanosilicon -- Tunable Single-Electron Turnstile Using Discrete Dopants in Nanoscale SOI-FETs -- KFM Observation of Electron Charging and Discharging in Phosphorus-Doped SOI Channel -- Photoluminescence Characteristics of Ultra-Thin Silicon-on-Insulator at Low Temperatures -- Investigation about I-V Characteristics in a New Electronic Structure Model of the Ohmic Contact for Future Nano-Scale Ohmic Contact -- Collective Electron Tunneling Model in Si-Nano Dot Floating Gate MOS Structure -- Electronic Structure and Spin-Injection of Co-Based Heusler Alloy/ Semiconductor Junctions -- First-Principles Calculations of the Dielectric Constant for the GeO2 Films -- Nanosize Electronics Material Analysis by Local Quantities Based on the Rigged QED Theory -- Novel Source Heterojunction Structures with Relaxed-/Strained-Layers for Quasi-Ballistic CMOS Transistors -- Effect of Al2O3 Deposition and Subsequent Annealing on Passivation of Defects in Ge-Rich SiGe-on-Insulator -- Controlled Synthesis of Carbon Nanowalls for Carbon Channel Engineering -- Resistive Memory Utilizing Ferritin Protein with Nano Particle -- Atomically Controlled Plasma Processing for Group IV Quantum Heterostructure Formation -- Nanometer-Scale Characterization Technique for Si Nanoelectric Materials Using Synchrotron Radiation Microdiffraction -- Generation and Growth of Atomic-Scale Roughness at Surface and Interface of Silicon Dioxide Thermally Grown on Atomically Flat Si Surface -- Nano-Surface Modification of Silicon with Ultra-Short Pulse Laser Process -- Evaluation of Strained Silicon by Electron Back Scattering Pattern Compared with Raman Measurement and Edge Force Model Calculation -- Development of New Methods for Fine-Wiring in Si Using a Wet Catalytic Reaction -- Optical Response of Si-Quantum-Dots/NiSi-Nanodots Stack Hybrid Floating Gate in MOS Structures -- Energy Band Engineering of Metal Nanodots for High Performance Nonvolatile Memory Application -- Strained Ge and Ge1-xSnx Technology for Future CMOS Devices -- Improved Electrical Properties and Thermal Stability of GeON Gate Dielectrics Formed by Plasma Nitridation of Ultrathin Oxides on Ge(100) -- Structural Change during the Formation of Directly Bonded Silicon Substrates -- Microscopic Structure of Directly Bonded Silicon Substrates -- Formation of Nanotubes of Carbon by Joule Heating of Carbon-Contaminated Si Nanochains -- Si Nanodot Device Fabricated by Thermal Oxidation and their Applications -- Influences of Carrier Transport on Drain-Current Variability of MOSFETs -- Resistive Switching in NiO Bilayer Films with Different Crystallinity Layers -- Analysis of Threshold Voltage Variations in Fin Field Effect Transistors -- Capture/Emission Processes of Carriers in Heterointerface Traps Observed in the Transient Charge-Pumping Characteristics of SiGe/Si-Hetero-Channel pMOSFETs -- Quasi-Ballistic Transport in Nano-Scale Devices: Boundary Layer, Potential Fluctuation, and Coulomb Interaction -- Effect of Back Bias on Variability in Intrinsic Channel SOI MOSFETs -- Discrete Dopant Effects on Threshold Voltage Variation in Double-Gate and Gate-All-Around Metal-Oxide-Semiconductor Field-Effect-Transistors -- Interconnect Design Challenges in Nano CMOS Circuit....”
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