Search Results - "scanning tunneling microscopy"

Introduction to scanning tunneling microscopy by Chen, C. Julian

Subjects: “…Scanning tunneling microscopy.…”
An electronic book accessible through the World Wide Web; click to view

Introduction to scanning tunneling microscopy by Chen, C. Julian

Subjects: “…Scanning tunneling microscopy.…”
An electronic book accessible through the World Wide Web; click to view

Haptic visions : rhetorics of the digital image, information, and nonotechnology / by Hanson, Valerie L., 1969-

Subjects: An electronic book accessible through the World Wide Web; click to view

Haptic visions : rhetorics of the digital image, information, and nonotechnology / by Hanson, Valerie L., 1969-

Subjects: An electronic book accessible through the World Wide Web; click to view

In-situ characterization of heterogeneous catalysts

Table of Contents: “…Chupas (Argonne National Laboratory) Chapter 6: Neutron Scattering for In-situ Characterization of Catalysts Ashfia Huq (Oak Ridge National Laboratory), Wei-Ren Chen (Oak Ridge National Laboratory) Chapter 7: Visualization of Surface Structures of Heterogeneous Catalysts under Reaction Conditions or during Catalysis with High Pressure Scanning Tunneling Microscopy Franklyn (Feng) Tao (University of Notre Dame), Yingchun Ye (University of Notre Dame), Yuan Zhu (University of Notre Dame), Shiran Zhang (University of Notre Dame), Lei Wang (University of Notre Dame), Fang Cheng (University of Notre Dame) Chapter 8: In-situ Infrared Spectroscopy on Well-defined Model Catalysts Dario Stacchiola (Brookhaven National Laboratory), Kumudu Mudiyanselage (Brookhaven National Laboratory) Chapter 9: Infrared Spectroscopy on Powder Catalysts Eli Stavitski (Brookhaven National Laboratory) Chapter 10: Structural Characterization of Catalysts by Operando Raman Spectroscopy Miguel A. …”
An electronic book accessible through the World Wide Web; click to view

In-situ characterization of heterogeneous catalysts

Table of Contents: “…Chupas (Argonne National Laboratory) Chapter 6: Neutron Scattering for In-situ Characterization of Catalysts Ashfia Huq (Oak Ridge National Laboratory), Wei-Ren Chen (Oak Ridge National Laboratory) Chapter 7: Visualization of Surface Structures of Heterogeneous Catalysts under Reaction Conditions or during Catalysis with High Pressure Scanning Tunneling Microscopy Franklyn (Feng) Tao (University of Notre Dame), Yingchun Ye (University of Notre Dame), Yuan Zhu (University of Notre Dame), Shiran Zhang (University of Notre Dame), Lei Wang (University of Notre Dame), Fang Cheng (University of Notre Dame) Chapter 8: In-situ Infrared Spectroscopy on Well-defined Model Catalysts Dario Stacchiola (Brookhaven National Laboratory), Kumudu Mudiyanselage (Brookhaven National Laboratory) Chapter 9: Infrared Spectroscopy on Powder Catalysts Eli Stavitski (Brookhaven National Laboratory) Chapter 10: Structural Characterization of Catalysts by Operando Raman Spectroscopy Miguel A. …”
An electronic book accessible through the World Wide Web; click to view

Characterization of tribological materials

Table of Contents: “…Appendices: technique summaries -- Light microscopy -- Scanning electron microscopy (SEM) -- In situ wear device for the scanning electron microscope -- Scanning tunneling microscopy and scanning force microscopy (STM and SFM) -- Transmission electron microscopy (TEM) -- Energy-dispersive x-ray spectroscopy (EDS) -- Scanning transmission electron microscopy (STEM) -- Electron probe x-ray microanalysis (EPMA) -- X-ray diffraction (XRD) -- Low-energy electron diffraction (LEED) -- X-ray photoelectron spectroscopy (XPS) -- Auger electron spectroscopy (AES) -- Fourier transform infrared spectroscopy (FTIR) -- Raman spectroscopy -- Rutherford backscattering spectrometry (RBS) -- Static secondary ion mass spectrometry (static SIMS) -- Surface roughness: measurement, formation by sputtering, impact on depth profiling -- Index.…”
An electronic book accessible through the World Wide Web; click to view

Characterization of tribological materials

Table of Contents: “…Appendices: technique summaries -- Light microscopy -- Scanning electron microscopy (SEM) -- In situ wear device for the scanning electron microscope -- Scanning tunneling microscopy and scanning force microscopy (STM and SFM) -- Transmission electron microscopy (TEM) -- Energy-dispersive x-ray spectroscopy (EDS) -- Scanning transmission electron microscopy (STEM) -- Electron probe x-ray microanalysis (EPMA) -- X-ray diffraction (XRD) -- Low-energy electron diffraction (LEED) -- X-ray photoelectron spectroscopy (XPS) -- Auger electron spectroscopy (AES) -- Fourier transform infrared spectroscopy (FTIR) -- Raman spectroscopy -- Rutherford backscattering spectrometry (RBS) -- Static secondary ion mass spectrometry (static SIMS) -- Surface roughness: measurement, formation by sputtering, impact on depth profiling -- Index.…”
An electronic book accessible through the World Wide Web; click to view