檢索結果 - "Integrated circuits Very large scale integration Testing."
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1
VLSI test principles and architectures design for testability /
出版 2006主題: “...Integrated circuits Very large scale integration Testing....”
An electronic book accessible through the World Wide Web; click to view
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2
Power-constrained testing of VLSI circuits
出版 2003主題: “...Integrated circuits Very large scale integration Testing....”
An electronic book accessible through the World Wide Web; click to view
電子 電子書 -
3
System-on-chip test architectures nanometer design for testability /
出版 2008主題: “...Integrated circuits Very large scale integration Testing....”
An electronic book accessible through the World Wide Web; click to view
電子 電子書