Результати пошуку - "Integrated circuits Very large scale integration Testing."
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Рекомендовані теми у межах Вашого пошуку.
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1
VLSI test principles and architectures design for testability /
Опубліковано 2006Предмети: “...Integrated circuits Very large scale integration Testing....”
An electronic book accessible through the World Wide Web; click to view
Електронний ресурс eКнига -
2
Power-constrained testing of VLSI circuits
Опубліковано 2003Предмети: “...Integrated circuits Very large scale integration Testing....”
An electronic book accessible through the World Wide Web; click to view
Електронний ресурс eКнига -
3
System-on-chip test architectures nanometer design for testability /
Опубліковано 2008Предмети: “...Integrated circuits Very large scale integration Testing....”
An electronic book accessible through the World Wide Web; click to view
Електронний ресурс eКнига