Sökresultat - "Integrated circuits Very large scale integration Testing."

VLSI test principles and architectures design for testability /

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An electronic book accessible through the World Wide Web; click to view

Power-constrained testing of VLSI circuits av Nicolici, Nicola

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An electronic book accessible through the World Wide Web; click to view

System-on-chip test architectures nanometer design for testability /

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An electronic book accessible through the World Wide Web; click to view