Результаты поиска - "Integrated circuits Very large scale integration Testing."

  • Отображение 1 - 3 результаты of 3
Отмена результатов
  1. 1

    VLSI test principles and architectures design for testability /

    Опубликовано 2006
    Предметы: “...Integrated circuits Very large scale integration Testing....”
    An electronic book accessible through the World Wide Web; click to view
    Электронный ресурс eКнига
  2. 2

    Power-constrained testing of VLSI circuits по Nicolici, Nicola

    Опубликовано 2003
    Предметы: “...Integrated circuits Very large scale integration Testing....”
    An electronic book accessible through the World Wide Web; click to view
    Электронный ресурс eКнига
  3. 3

    System-on-chip test architectures nanometer design for testability /

    Опубликовано 2008
    Предметы: “...Integrated circuits Very large scale integration Testing....”
    An electronic book accessible through the World Wide Web; click to view
    Электронный ресурс eКнига