Resultados da pesquisa - "Integrated circuits Ultra large scale integration Reliability."

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    Terrestrial radiation effects in ULSI devices and electronic systems / Por Ibe, Eishi H.

    Publicado em 2015
    Assuntos: “...Integrated circuits Ultra large scale integration Reliability....”
    An electronic book accessible through the World Wide Web; click to view
    Recurso Electrónico livro electrónico