Ngā hua rapu - "Integrated circuits Very large scale integration Testing."
Ngā kaupapa kua whakahuatia i roto i tō rapu.
Ngā kaupapa kua whakahuatia i roto i tō rapu.
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1
VLSI test principles and architectures design for testability /
I whakaputaina 2006Ngā marau: “…Integrated circuits Very large scale integration Testing.…”
An electronic book accessible through the World Wide Web; click to view
Tāhiko īPukapuka -
2
Power-constrained testing of VLSI circuits
I whakaputaina 2003Ngā marau: “…Integrated circuits Very large scale integration Testing.…”
An electronic book accessible through the World Wide Web; click to view
Tāhiko īPukapuka -
3
System-on-chip test architectures nanometer design for testability /
I whakaputaina 2008Ngā marau: “…Integrated circuits Very large scale integration Testing.…”
An electronic book accessible through the World Wide Web; click to view
Tāhiko īPukapuka