Ngā hua rapu - "Integrated circuits Very large scale integration Testing."

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  1. 1

    VLSI test principles and architectures design for testability /

    I whakaputaina 2006
    Ngā marau: “…Integrated circuits Very large scale integration Testing.…”
    An electronic book accessible through the World Wide Web; click to view
    Tāhiko īPukapuka
  2. 2

    Power-constrained testing of VLSI circuits Nicolici, Nicola

    I whakaputaina 2003
    Ngā marau: “…Integrated circuits Very large scale integration Testing.…”
    An electronic book accessible through the World Wide Web; click to view
    Tāhiko īPukapuka
  3. 3

    System-on-chip test architectures nanometer design for testability /

    I whakaputaina 2008
    Ngā marau: “…Integrated circuits Very large scale integration Testing.…”
    An electronic book accessible through the World Wide Web; click to view
    Tāhiko īPukapuka