検索結果 - "Integrated circuits Very large scale integration Testing."

VLSI test principles and architectures design for testability /

主題: “…Integrated circuits Very large scale integration Testing.…”
An electronic book accessible through the World Wide Web; click to view

Power-constrained testing of VLSI circuits 著者: Nicolici, Nicola

主題: “…Integrated circuits Very large scale integration Testing.…”
An electronic book accessible through the World Wide Web; click to view

System-on-chip test architectures nanometer design for testability /

主題: “…Integrated circuits Very large scale integration Testing.…”
An electronic book accessible through the World Wide Web; click to view