खोज परिणाम - "Integrated circuits Very large scale integration Testing."
प्रस्तावित विषय : खोज निहित
प्रस्तावित विषय : खोज निहित
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1
VLSI test principles and architectures design for testability /
प्रकाशित 2006विषय: “…Integrated circuits Very large scale integration Testing.…”
An electronic book accessible through the World Wide Web; click to view
इलेक्ट्रोनिक ई-पुस्तक -
2
Power-constrained testing of VLSI circuits
प्रकाशित 2003विषय: “…Integrated circuits Very large scale integration Testing.…”
An electronic book accessible through the World Wide Web; click to view
इलेक्ट्रोनिक ई-पुस्तक -
3
System-on-chip test architectures nanometer design for testability /
प्रकाशित 2008विषय: “…Integrated circuits Very large scale integration Testing.…”
An electronic book accessible through the World Wide Web; click to view
इलेक्ट्रोनिक ई-पुस्तक