Canlyniadau Chwilio - "Integrated circuits Very large scale integration Testing."

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Mireinio'r Canlyniadau
  1. 1

    VLSI test principles and architectures design for testability /

    Cyhoeddwyd 2006
    Pynciau: “...Integrated circuits Very large scale integration Testing....”
    An electronic book accessible through the World Wide Web; click to view
    Electronig eLyfr
  2. 2

    Power-constrained testing of VLSI circuits gan Nicolici, Nicola

    Cyhoeddwyd 2003
    Pynciau: “...Integrated circuits Very large scale integration Testing....”
    An electronic book accessible through the World Wide Web; click to view
    Electronig eLyfr
  3. 3

    System-on-chip test architectures nanometer design for testability /

    Cyhoeddwyd 2008
    Pynciau: “...Integrated circuits Very large scale integration Testing....”
    An electronic book accessible through the World Wide Web; click to view
    Electronig eLyfr