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  1. 1
    Ata uhi

    High performance memory testing design principles, fault modeling, and self-test / mā Adams, R. Dean

    I whakaputaina 2003
    An electronic book accessible through the World Wide Web; click to view
    Tāhiko īPukapuka

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  2. 2
    Ata uhi

    Terrestrial neutron-induced soft errors in advanced memory devices

    I whakaputaina 2008
    An electronic book accessible through the World Wide Web; click to view
    Tāhiko īPukapuka

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  3. 3
    Ata uhi

    Vertical 3D memory technologies / mā Prince, Betty

    I whakaputaina 2014
    An electronic book accessible through the World Wide Web; click to view
    Tāhiko īPukapuka

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