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    To the digital age research labs, start-up companies, and the rise of MOS technology / 由 Bassett, Ross Knox, 1959-

    出版 2002
    An electronic book accessible through the World Wide Web; click to view
    电子 电子书

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  2. 2
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    Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /

    出版 2002
    An electronic book accessible through the World Wide Web; click to view
    电子 电子书

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    Technology evolution for silicon nano-electronics selected, peer reviewed papers from the proceedings of the International Symposium on Technology Evolution for Silicon Nano-Electr...

    出版 2011
    An electronic book accessible through the World Wide Web; click to view
    电子 会议录 电子书

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    Geometric models for rolling-shutter and push-broom sensors / 由 Ringaby, Erik

    出版 2014
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    电子 电子书

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