نتائج البحث

To the digital age research labs, start-up companies, and the rise of MOS technology / حسب Bassett, Ross Knox, 1959-

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Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /

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Technology evolution for silicon nano-electronics selected, peer reviewed papers from the proceedings of the International Symposium on Technology Evolution for Silicon Nano-Electr...

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Geometric models for rolling-shutter and push-broom sensors / حسب Ringaby, Erik

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