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  1. 1
    III-nitride semiconductor materials /

    III-nitride semiconductor materials /

    Gepubliceerd in 2006
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  2. 2
    The story of semiconductors

    The story of semiconductors door Orton, J. W. (John Wilfred)

    Gepubliceerd in 2004
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  3. 3
    Microelectronic failure analysis desk reference : 2001 supplement /

    Microelectronic failure analysis desk reference : 2001 supplement /

    Gepubliceerd in 2001
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  4. 4
    Microelectronic failure analysis desk reference.

    Microelectronic failure analysis desk reference.

    Gepubliceerd in 2002
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  5. 5
    Recent topics on modeling of semiconductor processes, devices, and circuits

    Recent topics on modeling of semiconductor processes, devices, and circuits door Onur Topaloglu, Rasit

    Gepubliceerd in 2011
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  6. 6
    Microelectronics failure analysis desk reference /

    Microelectronics failure analysis desk reference /

    Gepubliceerd in 2011
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  7. 7
    Semiconductor strain metrology principles and applications /

    Semiconductor strain metrology principles and applications / door Wong, Terence K. S.

    Gepubliceerd in 2012
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  8. 8
    One-dimensional nanostructures principles and applications /

    One-dimensional nanostructures principles and applications /

    Gepubliceerd in 2013
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  9. 9
    Nitride semiconductor devices fundamentals and applications /

    Nitride semiconductor devices fundamentals and applications / door Morkoç, Hadis

    Gepubliceerd in 2013
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  10. 10
    Advances in semiconducting materials /

    Advances in semiconducting materials /

    Gepubliceerd in 2009
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  11. 11
    HeteroSiC & WASMPE 2011 : selected, peer reviewed papers from the 4th Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications (HeteroSiC & WASMPE 2011), June 27-30, 2011, Tours, France /

    HeteroSiC & WASMPE 2011 : selected, peer reviewed papers from the 4th Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications (HeteroSiC & WASMP...

    Gepubliceerd in 2012
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  12. 12
    HeteroSiC & WASMPE 2013 : selected, peer reviewed paper from the 2013 HeteroSiC-WASMPE, June 17-19, 2013, Nice, France /

    HeteroSiC & WASMPE 2013 : selected, peer reviewed paper from the 2013 HeteroSiC-WASMPE, June 17-19, 2013, Nice, France /

    Gepubliceerd in 2015
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  13. 13
    MOCVD growth of GaN-based high electron mobility transistor structures /

    MOCVD growth of GaN-based high electron mobility transistor structures / door Chen, Jr-Tai

    Gepubliceerd in 2015
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  14. 14
    ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /

    ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /

    Gepubliceerd in 2015
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  15. 15
    Microelectronic failure analysis desk reference : 2001 supplement /

    Microelectronic failure analysis desk reference : 2001 supplement /

    Gepubliceerd in 2001
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  16. 16
    Microelectronic failure analysis desk reference.

    Microelectronic failure analysis desk reference.

    Gepubliceerd in 2002
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  17. 17
    Recent topics on modeling of semiconductor processes, devices, and circuits

    Recent topics on modeling of semiconductor processes, devices, and circuits door Onur Topaloglu, Rasit

    Gepubliceerd in 2011
    An electronic book accessible through the World Wide Web; click to view
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  18. 18
    Microelectronics failure analysis desk reference /

    Microelectronics failure analysis desk reference /

    Gepubliceerd in 2011
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  19. 19
    Semiconductor strain metrology principles and applications /

    Semiconductor strain metrology principles and applications / door Wong, Terence K. S.

    Gepubliceerd in 2012
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  20. 20
    One-dimensional nanostructures principles and applications /

    One-dimensional nanostructures principles and applications /

    Gepubliceerd in 2013
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