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  1. 1
    III-nitride semiconductor materials /

    III-nitride semiconductor materials /

    Udgivet 2006
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  2. 2
    The story of semiconductors

    The story of semiconductors af Orton, J. W. (John Wilfred)

    Udgivet 2004
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  3. 3
    Microelectronic failure analysis desk reference : 2001 supplement /

    Microelectronic failure analysis desk reference : 2001 supplement /

    Udgivet 2001
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  4. 4
    Microelectronic failure analysis desk reference.

    Microelectronic failure analysis desk reference.

    Udgivet 2002
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  5. 5
    Recent topics on modeling of semiconductor processes, devices, and circuits

    Recent topics on modeling of semiconductor processes, devices, and circuits af Onur Topaloglu, Rasit

    Udgivet 2011
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  6. 6
    Microelectronics failure analysis desk reference /

    Microelectronics failure analysis desk reference /

    Udgivet 2011
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  7. 7
    Semiconductor strain metrology principles and applications /

    Semiconductor strain metrology principles and applications / af Wong, Terence K. S.

    Udgivet 2012
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  8. 8
    One-dimensional nanostructures principles and applications /

    One-dimensional nanostructures principles and applications /

    Udgivet 2013
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  9. 9
    Nitride semiconductor devices fundamentals and applications /

    Nitride semiconductor devices fundamentals and applications / af Morkoç, Hadis

    Udgivet 2013
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  10. 10
    Advances in semiconducting materials /

    Advances in semiconducting materials /

    Udgivet 2009
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    Electronisk Conference Proceeding eBog
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  11. 11
    HeteroSiC & WASMPE 2011 : selected, peer reviewed papers from the 4th Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications (HeteroSiC & WASMPE 2011), June 27-30, 2011, Tours, France /

    HeteroSiC & WASMPE 2011 : selected, peer reviewed papers from the 4th Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications (HeteroSiC & WASMP...

    Udgivet 2012
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  12. 12
    HeteroSiC & WASMPE 2013 : selected, peer reviewed paper from the 2013 HeteroSiC-WASMPE, June 17-19, 2013, Nice, France /

    HeteroSiC & WASMPE 2013 : selected, peer reviewed paper from the 2013 HeteroSiC-WASMPE, June 17-19, 2013, Nice, France /

    Udgivet 2015
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  13. 13
    MOCVD growth of GaN-based high electron mobility transistor structures /

    MOCVD growth of GaN-based high electron mobility transistor structures / af Chen, Jr-Tai

    Udgivet 2015
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  14. 14
    ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /

    ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /

    Udgivet 2015
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  15. 15
    Microelectronic failure analysis desk reference : 2001 supplement /

    Microelectronic failure analysis desk reference : 2001 supplement /

    Udgivet 2001
    An electronic book accessible through the World Wide Web; click to view
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  16. 16
    Microelectronic failure analysis desk reference.

    Microelectronic failure analysis desk reference.

    Udgivet 2002
    An electronic book accessible through the World Wide Web; click to view
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  17. 17
    Recent topics on modeling of semiconductor processes, devices, and circuits

    Recent topics on modeling of semiconductor processes, devices, and circuits af Onur Topaloglu, Rasit

    Udgivet 2011
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  18. 18
    Microelectronics failure analysis desk reference /

    Microelectronics failure analysis desk reference /

    Udgivet 2011
    An electronic book accessible through the World Wide Web; click to view
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  19. 19
    Semiconductor strain metrology principles and applications /

    Semiconductor strain metrology principles and applications / af Wong, Terence K. S.

    Udgivet 2012
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  20. 20
    One-dimensional nanostructures principles and applications /

    One-dimensional nanostructures principles and applications /

    Udgivet 2013
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