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  1. 1
    Wafer-level testing and test during burn-in for integrated circuits

    Wafer-level testing and test during burn-in for integrated circuits by Bahukudumbi, Sudarshan

    Published 2010
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    An electronic book accessible through the World Wide Web; click to view
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  2. 2
    Wafer-level testing and test during burn-in for integrated circuits

    Wafer-level testing and test during burn-in for integrated circuits by Bahukudumbi, Sudarshan

    Published 2010
    Subjects:
    An electronic book accessible through the World Wide Web; click to view
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  3. 3
    High performance memory testing design principles, fault modeling, and self-test /

    High performance memory testing design principles, fault modeling, and self-test / by Adams, R. Dean

    Published 2003
    Subjects: “…Semiconductor storage devices Testing.…”
    An electronic book accessible through the World Wide Web; click to view
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  4. 4
    High performance memory testing design principles, fault modeling, and self-test /

    High performance memory testing design principles, fault modeling, and self-test / by Adams, R. Dean

    Published 2003
    Subjects: “…Semiconductor storage devices Testing.…”
    An electronic book accessible through the World Wide Web; click to view
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  5. 5
    ESD failure mechanisms and models /

    ESD failure mechanisms and models / by Voldman, Steven H.

    Published 2009
    Subjects: “…Semiconductors Failures.…”
    An electronic book accessible through the World Wide Web; click to view
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  6. 6
    ESD failure mechanisms and models /

    ESD failure mechanisms and models / by Voldman, Steven H.

    Published 2009
    Subjects: “…Semiconductors Failures.…”
    An electronic book accessible through the World Wide Web; click to view
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  7. 7
    ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /

    ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /

    Published 2015
    Subjects:
    An electronic book accessible through the World Wide Web; click to view
    Electronic Conference Proceeding eBook
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  8. 8
    ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /

    ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /

    Published 2015
    Subjects:
    An electronic book accessible through the World Wide Web; click to view
    Electronic Conference Proceeding eBook
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  9. 9
    Power-constrained testing of VLSI circuits

    Power-constrained testing of VLSI circuits by Nicolici, Nicola

    Published 2003
    Subjects:
    An electronic book accessible through the World Wide Web; click to view
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  10. 10
    Power-constrained testing of VLSI circuits

    Power-constrained testing of VLSI circuits by Nicolici, Nicola

    Published 2003
    Subjects:
    An electronic book accessible through the World Wide Web; click to view
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  11. 11
    Microelectronic failure analysis desk reference : 2001 supplement /

    Microelectronic failure analysis desk reference : 2001 supplement /

    Published 2001
    Subjects:
    An electronic book accessible through the World Wide Web; click to view
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  12. 12
    Microelectronic failure analysis desk reference.

    Microelectronic failure analysis desk reference.

    Published 2002
    Subjects:
    An electronic book accessible through the World Wide Web; click to view
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  13. 13
    Microelectronics failure analysis desk reference /

    Microelectronics failure analysis desk reference /

    Published 2011
    Subjects:
    An electronic book accessible through the World Wide Web; click to view
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  14. 14
    Microelectronic failure analysis desk reference : 2001 supplement /

    Microelectronic failure analysis desk reference : 2001 supplement /

    Published 2001
    Subjects:
    An electronic book accessible through the World Wide Web; click to view
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  15. 15
    Microelectronic failure analysis desk reference.

    Microelectronic failure analysis desk reference.

    Published 2002
    Subjects:
    An electronic book accessible through the World Wide Web; click to view
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  16. 16
    Microelectronics failure analysis desk reference /

    Microelectronics failure analysis desk reference /

    Published 2011
    Subjects:
    An electronic book accessible through the World Wide Web; click to view
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