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  1. 1
    ESD failure mechanisms and models /

    ESD failure mechanisms and models / by Voldman, Steven H.

    Published 2009
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  2. 2
    ESD failure mechanisms and models /

    ESD failure mechanisms and models / by Voldman, Steven H.

    Published 2009
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  3. 3
    Wafer-level testing and test during burn-in for integrated circuits

    Wafer-level testing and test during burn-in for integrated circuits by Bahukudumbi, Sudarshan

    Published 2010
    Subjects: “…Integrated circuits Testing.…”
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  4. 4
    Wafer-level testing and test during burn-in for integrated circuits

    Wafer-level testing and test during burn-in for integrated circuits by Bahukudumbi, Sudarshan

    Published 2010
    Subjects: “…Integrated circuits Testing.…”
    An electronic book accessible through the World Wide Web; click to view
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  5. 5
    High-speed heterostructure devices from device concepts to circuit modeling /

    High-speed heterostructure devices from device concepts to circuit modeling / by Roblin, Patrick, 1958-

    Published 2002
    Subjects: “…Very high speed integrated circuits.…”
    An electronic book accessible through the World Wide Web; click to view
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  6. 6
    High-speed heterostructure devices from device concepts to circuit modeling /

    High-speed heterostructure devices from device concepts to circuit modeling / by Roblin, Patrick, 1958-

    Published 2002
    Subjects: “…Very high speed integrated circuits.…”
    An electronic book accessible through the World Wide Web; click to view
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  7. 7
    ESD : analog circuits and design /

    ESD : analog circuits and design / by Voldman, Steven H.

    Published 2015
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  8. 8
    ESD : analog circuits and design /

    ESD : analog circuits and design / by Voldman, Steven H.

    Published 2015
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  9. 9
    Fundamentals of silicon carbide technology : growth, characterization, devices and applications /

    Fundamentals of silicon carbide technology : growth, characterization, devices and applications / by Kimoto, Tsunenobu, 1963-, Cooper, James A., 1946-

    Published 2014
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  10. 10
    Fundamentals of silicon carbide technology : growth, characterization, devices and applications /

    Fundamentals of silicon carbide technology : growth, characterization, devices and applications / by Kimoto, Tsunenobu, 1963-, Cooper, James A., 1946-

    Published 2014
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  11. 11
    Power-constrained testing of VLSI circuits

    Power-constrained testing of VLSI circuits by Nicolici, Nicola

    Published 2003
    Subjects: “…Integrated circuits Very large scale integration Testing.…”
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  12. 12
    Advanced high speed devices

    Advanced high speed devices

    Published 2010
    Subjects: “…Very high speed integrated circuits Congresses.…”
    An electronic book accessible through the World Wide Web; click to view
    Electronic Conference Proceeding eBook
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  13. 13
    Advanced high speed devices

    Advanced high speed devices

    Published 2010
    Subjects: “…Very high speed integrated circuits Congresses.…”
    An electronic book accessible through the World Wide Web; click to view
    Electronic Conference Proceeding eBook
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  14. 14
    Power-constrained testing of VLSI circuits

    Power-constrained testing of VLSI circuits by Nicolici, Nicola

    Published 2003
    Subjects: “…Integrated circuits Very large scale integration Testing.…”
    An electronic book accessible through the World Wide Web; click to view
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  15. 15
    Design of analog-digital VLSI circuits for telecommunications and ... /

    Design of analog-digital VLSI circuits for telecommunications and ... / by Franca, Jose E.

    Published 1994
    Subjects: “…Integrated circuits Very large scale integration.…”
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  16. 16
    Design of analog-digital VLSI circuits for telecommunications and ... /

    Design of analog-digital VLSI circuits for telecommunications and ... / by Franca, Jose E.

    Published 1994
    Subjects: “…Integrated circuits Very large scale integration.…”
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  17. 17
    Advanced semiconductor devices proceedings of the 2006 Lester Eastman Conference, Cornell, Ithaca, NY, USA, 26 August 2006 /

    Advanced semiconductor devices proceedings of the 2006 Lester Eastman Conference, Cornell, Ithaca, NY, USA, 26 August 2006 /

    Published 2007
    Subjects: “…Very high speed integrated circuits Congresses.…”
    An electronic book accessible through the World Wide Web; click to view
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  18. 18
    Advanced semiconductor devices proceedings of the 2006 Lester Eastman Conference, Cornell, Ithaca, NY, USA, 26 August 2006 /

    Advanced semiconductor devices proceedings of the 2006 Lester Eastman Conference, Cornell, Ithaca, NY, USA, 26 August 2006 /

    Published 2007
    Subjects: “…Very high speed integrated circuits Congresses.…”
    An electronic book accessible through the World Wide Web; click to view
    Electronic Conference Proceeding eBook
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  19. 19
    Microelectronic circuit design /

    Microelectronic circuit design / by Jaeger, Richard C.

    Published 2006
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  20. 20
    Semiconductor terahertz technology : devices and systems at room temperature operation /

    Semiconductor terahertz technology : devices and systems at room temperature operation /

    Published 2015
    Subjects: “…Very high speed integrated circuits.…”
    An electronic book accessible through the World Wide Web; click to view
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