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  1. 1
    To the digital age research labs, start-up companies, and the rise of MOS technology /

    To the digital age research labs, start-up companies, and the rise of MOS technology / by Bassett, Ross Knox, 1959-

    Published 2002
    An electronic book accessible through the World Wide Web; click to view
    Electronic eBook
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  2. 2
    Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /

    Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /

    Published 2002
    An electronic book accessible through the World Wide Web; click to view
    Electronic eBook
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  3. 3
    Technology evolution for silicon nano-electronics selected, peer reviewed papers from the proceedings of the International Symposium on Technology Evolution for Silicon Nano-Electronics 2010, June 3-5, 2010, Tokyo Institute of Technology, Tokyo, Japan /

    Technology evolution for silicon nano-electronics selected, peer reviewed papers from the proceedings of the International Symposium on Technology Evolution for Silicon Nano-Electr...

    Published 2011
    An electronic book accessible through the World Wide Web; click to view
    Electronic Conference Proceeding eBook
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  4. 4
    Technology evolution for silicon nano-electronics selected, peer reviewed papers from the proceedings of the International Symposium on Technology Evolution for Silicon Nano-Electronics 2010, June 3-5, 2010, Tokyo Institute of Technology, Tokyo, Japan /

    Technology evolution for silicon nano-electronics selected, peer reviewed papers from the proceedings of the International Symposium on Technology Evolution for Silicon Nano-Electr...

    Published 2011
    An electronic book accessible through the World Wide Web; click to view
    Electronic Conference Proceeding eBook
    Save to List
    Saved in:
  5. 5
    To the digital age research labs, start-up companies, and the rise of MOS technology /

    To the digital age research labs, start-up companies, and the rise of MOS technology / by Bassett, Ross Knox, 1959-

    Published 2002
    An electronic book accessible through the World Wide Web; click to view
    Electronic eBook
    Save to List
    Saved in:
  6. 6
    Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /

    Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /

    Published 2002
    An electronic book accessible through the World Wide Web; click to view
    Electronic eBook
    Save to List
    Saved in:

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