Suggested Topics within your search.
Suggested Topics within your search.
- Integrated circuits
- Testing
- Semiconductors 6
- Very large scale integration 6
- Design 4
- Protection 4
- Systems on a chip 4
- Electric discharges 2
- Electronic apparatus and appliances 2
- Electrostatics 2
- Failures 2
- Formal methods (Computer science) 2
- Reliability 2
- Thermal properties 2
- Verification 2
- Wafer-scale integration 2
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Design for at-speed test, diagnosis, and measurement
Published 2000An electronic book accessible through the World Wide Web; click to view
Electronic eBook -
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Power-constrained testing of VLSI circuits
Published 2003An electronic book accessible through the World Wide Web; click to view
Electronic eBook -
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Verification techniques for system-level design
Published 2008An electronic book accessible through the World Wide Web; click to view
Electronic eBook -
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ESD failure mechanisms and models /
Published 2009An electronic book accessible through the World Wide Web; click to view
Electronic eBook -
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ESD failure mechanisms and models /
Published 2009An electronic book accessible through the World Wide Web; click to view
Electronic eBook -
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10
Design for at-speed test, diagnosis, and measurement
Published 2000An electronic book accessible through the World Wide Web; click to view
Electronic eBook -
11
Power-constrained testing of VLSI circuits
Published 2003An electronic book accessible through the World Wide Web; click to view
Electronic eBook -
12
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14
Verification techniques for system-level design
Published 2008An electronic book accessible through the World Wide Web; click to view
Electronic eBook