Suggested Topics within your search.
Suggested Topics within your search.
- Electronic apparatus and appliances
- Testing
- Electronics 46
- Materials 46
- Semiconductors 8
- Defects 6
- Microelectronics 6
- Reliability 4
- Automatic test equipment 2
- Boundary scan testing 2
- Design and construction 2
- Electric apparatus and appliances 2
- Electric contacts 2
- Electronic packaging 2
- Electronic systems 2
- Integrated circuits 2
- Prevention 2
- System failures (Engineering) 2
-
1
Design for at-speed test, diagnosis, and measurement
Published 2000An electronic book accessible through the World Wide Web; click to view
Electronic eBook -
2
A designer's guide to built-in self-test
Published 2002An electronic book accessible through the World Wide Web; click to view
Electronic eBook -
3
Boundary-scan interconnect diagnosis
Published 2001An electronic book accessible through the World Wide Web; click to view
Electronic eBook -
4
Parts selection and management
Published 2004An electronic book accessible through the World Wide Web; click to view
Electronic eBook -
5
ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Published 2008An electronic book accessible through the World Wide Web; click to view
Electronic Conference Proceeding eBook -
6
-
7
ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
Published 2007An electronic book accessible through the World Wide Web; click to view
Electronic Conference Proceeding eBook -
8
-
9
-
10
-
11
-
12
-
13
-
14
ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
Published 1998An electronic book accessible through the World Wide Web; click to view
Electronic Conference Proceeding eBook -
15
ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
Published 1996An electronic book accessible through the World Wide Web; click to view
Electronic Conference Proceeding eBook -
16
ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Published 2004An electronic book accessible through the World Wide Web; click to view
Electronic Conference Proceeding eBook -
17
-
18
-
19
Microelectronic failure analysis desk reference.
Published 2002An electronic book accessible through the World Wide Web; click to view
Electronic eBook -
20
ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, Califo...
Published 2009An electronic book accessible through the World Wide Web; click to view
Electronic Conference Proceeding eBook