Suggested Topics within your search.
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- Electronic apparatus and appliances
- Electronics
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- Testing 23
- Semiconductors 4
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- TECHNOLOGY / Electronics / Circuits / General 1
- TECHNOLOGY / Electronics / General 1
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Electronic materials science
Published 2005An electronic book accessible through the World Wide Web; click to view
Electronic eBook -
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ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Published 2008An electronic book accessible through the World Wide Web; click to view
Electronic Conference Proceeding eBook -
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ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
Published 2007An electronic book accessible through the World Wide Web; click to view
Electronic Conference Proceeding eBook -
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ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
Published 1998An electronic book accessible through the World Wide Web; click to view
Electronic Conference Proceeding eBook -
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ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
Published 1996An electronic book accessible through the World Wide Web; click to view
Electronic Conference Proceeding eBook -
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ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Published 2004An electronic book accessible through the World Wide Web; click to view
Electronic Conference Proceeding eBook -
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Microelectronic failure analysis desk reference.
Published 2002An electronic book accessible through the World Wide Web; click to view
Electronic eBook -
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Electronic components and processes
Published 2006An electronic book accessible through the World Wide Web; click to view
Electronic eBook -
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ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, Califo...
Published 2009An electronic book accessible through the World Wide Web; click to view
Electronic Conference Proceeding eBook -
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ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
Published 2010An electronic book accessible through the World Wide Web; click to view
Electronic Conference Proceeding eBook