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  1. 1
    III-nitride semiconductor materials /

    III-nitride semiconductor materials /

    Pubblicazione 2006
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  2. 2
    The story of semiconductors

    The story of semiconductors di Orton, J. W. (John Wilfred)

    Pubblicazione 2004
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  3. 3
    Microelectronic failure analysis desk reference : 2001 supplement /

    Microelectronic failure analysis desk reference : 2001 supplement /

    Pubblicazione 2001
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  4. 4
    Microelectronic failure analysis desk reference.

    Microelectronic failure analysis desk reference.

    Pubblicazione 2002
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  5. 5
    Recent topics on modeling of semiconductor processes, devices, and circuits

    Recent topics on modeling of semiconductor processes, devices, and circuits di Onur Topaloglu, Rasit

    Pubblicazione 2011
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  6. 6
    Microelectronics failure analysis desk reference /

    Microelectronics failure analysis desk reference /

    Pubblicazione 2011
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  7. 7
    Semiconductor strain metrology principles and applications /

    Semiconductor strain metrology principles and applications / di Wong, Terence K. S.

    Pubblicazione 2012
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  8. 8
    One-dimensional nanostructures principles and applications /

    One-dimensional nanostructures principles and applications /

    Pubblicazione 2013
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  9. 9
    Nitride semiconductor devices fundamentals and applications /

    Nitride semiconductor devices fundamentals and applications / di Morkoç, Hadis

    Pubblicazione 2013
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  10. 10
    Advances in semiconducting materials /

    Advances in semiconducting materials /

    Pubblicazione 2009
    An electronic book accessible through the World Wide Web; click to view
    Elettronico Atti del Convegno eBook
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  11. 11
    HeteroSiC & WASMPE 2011 : selected, peer reviewed papers from the 4th Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications (HeteroSiC & WASMPE 2011), June 27-30, 2011, Tours, France /

    HeteroSiC & WASMPE 2011 : selected, peer reviewed papers from the 4th Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications (HeteroSiC & WASMP...

    Pubblicazione 2012
    An electronic book accessible through the World Wide Web; click to view
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  12. 12
    HeteroSiC & WASMPE 2013 : selected, peer reviewed paper from the 2013 HeteroSiC-WASMPE, June 17-19, 2013, Nice, France /

    HeteroSiC & WASMPE 2013 : selected, peer reviewed paper from the 2013 HeteroSiC-WASMPE, June 17-19, 2013, Nice, France /

    Pubblicazione 2015
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  13. 13
    MOCVD growth of GaN-based high electron mobility transistor structures /

    MOCVD growth of GaN-based high electron mobility transistor structures / di Chen, Jr-Tai

    Pubblicazione 2015
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  14. 14
    ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /

    ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /

    Pubblicazione 2015
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  15. 15
    Microelectronic failure analysis desk reference : 2001 supplement /

    Microelectronic failure analysis desk reference : 2001 supplement /

    Pubblicazione 2001
    An electronic book accessible through the World Wide Web; click to view
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  16. 16
    Microelectronic failure analysis desk reference.

    Microelectronic failure analysis desk reference.

    Pubblicazione 2002
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  17. 17
    Recent topics on modeling of semiconductor processes, devices, and circuits

    Recent topics on modeling of semiconductor processes, devices, and circuits di Onur Topaloglu, Rasit

    Pubblicazione 2011
    An electronic book accessible through the World Wide Web; click to view
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  18. 18
    Microelectronics failure analysis desk reference /

    Microelectronics failure analysis desk reference /

    Pubblicazione 2011
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  19. 19
    Semiconductor strain metrology principles and applications /

    Semiconductor strain metrology principles and applications / di Wong, Terence K. S.

    Pubblicazione 2012
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  20. 20
    One-dimensional nanostructures principles and applications /

    One-dimensional nanostructures principles and applications /

    Pubblicazione 2013
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